??? 04/04/08 14:01 Read: times |
#152957 - Simple tests use loopbacks Responding to: ???'s previous message |
Simple BIST (built in self test), if it is even applicable at all which is a discussion that can go on for a long time, can most economically implemented by using loop-back of spare resources.
Here are some examples: a - use a spare A/D channel to monitor some analogue parameter of your system. b - use a spare D/A to test an channel of your A/D or offset the signal of an already used channel in a predictable way. c - connect spare inputs to in-use logical outputs and diddle the outputs and check the inputs for expected behavior. d - use a spare output to gate UART output to UART input and do a serial wrap test. Michael Karas |
Topic | Author | Date |
only 3 empty pins while i need at least 8 o/p pins | 01/01/70 00:00 | |
What is it checking for Highs lows? | 01/01/70 00:00 | |
data aquisition system of a satellite | 01/01/70 00:00 | |
Is it really necessary? | 01/01/70 00:00 | |
unfortunatelly it is necessary | 01/01/70 00:00 | |
here's one way ... use it at your own risk ... | 01/01/70 00:00 | |
the self diagnosis | 01/01/70 00:00 | |
Correction | 01/01/70 00:00 | |
What you should ask him is ... | 01/01/70 00:00 | |
RE:What you should ask him is... | 01/01/70 00:00 | |
It's not pointless, but it is costly. | 01/01/70 00:00 | |
RE:Type of test | 01/01/70 00:00 | |
Simple tests use loopbacks | 01/01/70 00:00 | |
receiving inspection | 01/01/70 00:00 | |
RE:receiving inspection | 01/01/70 00:00 | |
You should probably do what your instructor says | 01/01/70 00:00 | |
RE:you should probably do what the instructor says | 01/01/70 00:00 | |
Instead the input buffers.. | 01/01/70 00:00 | |
aside from internal memory test and port checks | 01/01/70 00:00 | |
Thank you.....![]() | 01/01/70 00:00 |