| ??? 01/31/07 07:41 Read: times |
#131762 - Detailed memory testing Responding to: ???'s previous message |
Richard Erlacher said:
A thorough one-time test will look for stuck bits, address-data interaction (data in one region of the memory is affected by where it is located), internal logic failure (e.g. a write to one region affects data in another), and perhaps a number of other tests about which there is considerable prior art. See: http://www.8052.com/forum/read.phtml?id=128894 |
| Topic | Author | Date |
| memory test | 01/01/70 00:00 | |
| what\'s the logo on them? | 01/01/70 00:00 | |
| Logo | 01/01/70 00:00 | |
| have a look at the link... | 01/01/70 00:00 | |
| Power | 01/01/70 00:00 | |
| That's a UMC part # unless I miss my guess | 01/01/70 00:00 | |
| it depends | 01/01/70 00:00 | |
| How you test depends on what you want to find | 01/01/70 00:00 | |
| Detailed memory testing | 01/01/70 00:00 | |
| Insufficient? | 01/01/70 00:00 | |
What do you want to test for ? | 01/01/70 00:00 |