??? 07/27/07 08:15 Read: times |
#142395 - not operational burn-in and testing Responding to: ???'s previous message |
Lynn,
I think you misunderstood slightly what Erik wanted to say. Doug's intention is not to develop a burn-in procedure, but to perform destruction tests in order to determine the maximum operational temperature or whatever. Erik's point was, if I understood him correctly, that even if Doug would perform a certain "cooking" and the chip would survive, it does not mean that it is still perfectly OK. In other words, that the destruction test does not prove that the chip can be operated safely slightly below the point of irreversible destruction. It is of course OK to scare Doug with the details of various modes of failure, to point him out that there is much more beyond a process/chip qualification than just such destruction test... :-) JW |