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???
07/27/07 16:29
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#142455 - Proving the negative
Responding to: ???'s previous message
I can't prove that 100C didn't damage a chip, nor can I prove that the chip was not damaged by just looking at it.

And I admit that it is possible for a bad design to physically damage a chip by such things as creating an internal bus conflict.

But your typical processor has had any bad design feature fixed, and so any damage must result from known physical stresses.

At elevated temperatures, MOS transistors become weaker, and so high internal operating currents are not going to be a problem. So any problems should arise from:

1. Increased oxide leakages, which will tend to degrade Flash and EPROM memories.

2. Metal migration occurring at an elevated rate, which will reduce lifetime far into the future.

3. At about 177C, you are at the plastic curing temperature, and that can cause package failure.

But below 125C, these problems are going to be quite rare.


List of 25 messages in thread
TopicAuthorDate
Processing capability algorithm            01/01/70 00:00      
   At your computer, within a half an hour?            01/01/70 00:00      
      re: Processing capability algorithm            01/01/70 00:00      
         what is "fails outright"            01/01/70 00:00      
            re: Processing capability algorithm            01/01/70 00:00      
               Idea...            01/01/70 00:00      
               you can't do that            01/01/70 00:00      
               hummm, Oxford...            01/01/70 00:00      
   Look In the Space Program            01/01/70 00:00      
      there are some rad-hard '51's            01/01/70 00:00      
   re: Processing capability algorithm            01/01/70 00:00      
      the value of such test...            01/01/70 00:00      
         a bit iof emphasis            01/01/70 00:00      
            rethinking the value...            01/01/70 00:00      
            ESD, 100C operation, and corrosive gas            01/01/70 00:00      
               not operational burn-in and testing            01/01/70 00:00      
                  Pushing chip limits            01/01/70 00:00      
                     HUH?            01/01/70 00:00      
                        Authority vs Certainty            01/01/70 00:00      
                        the misunderstanding squared            01/01/70 00:00      
                           Misunderstanding cubed and baked            01/01/70 00:00      
                              OK I am not much of a chipmaker...            01/01/70 00:00      
                              also, the 100°C was an arbitrary number...            01/01/70 00:00      
                                 Proving the negative            01/01/70 00:00      
                                    this is the point.            01/01/70 00:00      

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