??? 07/27/07 16:05 Modified: 07/27/07 16:06 Read: times |
#142446 - also, the 100°C was an arbitrary number... Responding to: ???'s previous message |
... Erik has chosen to stress his point: that ANY time of apparently flawless operation at ANY temperature (in a one-time destruction test) does not prove that the chip did not develop hidden flaws (such as decreased ESD protection, but possibly also others).
Now try to say the opposite, Lynn. :-) JW |