I'm persuaded that it isn't a good idea to bias nWE and nCS in the negative direction, as we don't know what the behavior of the associated logic will be as Vcc falls. Also, if one's trying to discern the behavior of the MCU or BBRAM in this context of falling Vcc, affecting the bias on addresses and data may be disadvantageous in determining the actual behaviors of these components. I'm not sure of that, but with larger resistor values, there may be less risk of losing valuable information (not the memory content, but the way in which it is altered, if at all).


I'd guess that 1 Meg or even 10 Meg resistors would do the job.


Teasing out an intermittent failure such as what we're discussing is not a simple task, and I'm somewhat hesitant to bias the outcomes with added components. Wildly fluctuating power consumption is not so likely to produce the fault that is being sought out, since it's in a situation in which power is decaying anyway.

From where I sit, ideally, one would attempt to produce a consistent result, either a consistent failure, or a consistent absence of one, and then try to draw valid conclusions from the circumstances. What we have encountered so far, however, is an intermittent failure that gives no hint as to its origin.

RE